Analysis of failure mechanism based on semiconductor physics

The reliability analysis of semiconductor devices is mostly around its characterization of life, therefore it is mostly combined life test (LED life test) and analysis of failure mechanism to carry out. Because the theory life of LED can be up to 100,000 hours, usually it needs a long time for the general life test, when the test is over, the product also becomes a waste. For the long life LED device, it needs to choose the accelerated life test according to the conditions.

The accelerated life test can be classified according to methods: the constant stress accelerated life test, step stress accelerated life test and progressive stress accelerated life test.