The constant stress accelerated test and step stress accelerated test

The operation and control of the constant stress accelerated test is relatively simple, the technology has been relatively ripe, extrapolation data is accurate, so the life (LED Life Test)we obtained is reliability, the disadvantage is relatively time-consuming.

The step stress accelerated test now is the hot research, it can shorten the test time, reduce the requirements of the number of samples, it has higher test efficiency compared with the constant stress accelerated test, but it is mostly used in the determination of the stress range in earlier stage, for example, Jin Ling in the GaAs infrared lighting emitting diode accelerated life test, the current step test to find out the highest current stress that the tested devices can bear.