1 The lowest and highest storage temperature（Tstg）
2 The lowest and highest working environment temperature or tube base temperature（Tamb or Tcase）
3 Inverse peak voltage（VR）
Note: not used for the two pipe devices of the mutual end connection
4 The maximum continuous positive current (IF) and minus ratings curve or minus ratings coefficient in the25 ℃environment or the tube base temperature
5 The biggest positive current (IFM ) peak in the 25 ℃ environment or the tube base temperature when in the suitable place and under prescribed conditions
1 Test condition
The photoelectric parameters test of the device should be conducted according to the test condition required by this standard unless otherwise specified
1.1 Standard atmosphere condition
1.2 Standard atmosphere condition for arbitration test.
1.3 Environment condition
a）Test environment should have no impact on testing the accuracy of the mechanical vibration and electromagnetic interference.
b）The whole optoelectronic parameters of the device should be tested in thermal equilibrium unless otherwise specified.
c）The test system should have good connection to the ground
2 Parameters Requirements
Unless otherwise specified, the device testing should take preventive measures and keep the following tolerances. Although the test conditions specified in the relevant documents should be more strict than the following tolerance, but in general, should follow the following prescribed requirements.
a） The offset conditions should be within ±3％ of the specified value.
b） Input pulse characteristics, recurrence frequency rate and frequence error should be limited in ±10％
c） Error of measuring the switch parameters should be limited in ±5％
d） Error of measuring the DC parameters should be less than ±2％
e） Error of measuring the radiant power should be less than 5％
f） Error of measuring peak wavelength radiation should be less than ±2nm
g） Error of measuring half intensity angle should be less than 10％
h） Error of measuring luminous intensity should be less than 25％
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