Lisun Group Products List Part11: Environmental Testing
Environmental Chamber of Lisun Group: GDJS-*B: High and Low Temperature & Humidity Chamber. This temperature and humidity chamber is according to IEC 60068. SC-015: Dust Test Machine. The SC-015 Dustproof Test Machine on the basis of the national standard GB 2423.37-89, GB 4208-93, GB/T 4942.2-93, GB 7000.1-1996、GB 7001-1986, and so on. YWX/Q-010: This salt spray test machine is simulated atmosphere filled with tiny […]
LEDs Test Method: Values Transfer, Principle and Method
1 Values Transfer The luminous intensity is the main optical parameters of LED device, because of the point light source and anisotropy of some LED, in the near field conditions, LED spectrophotometry test process can produce a lot of errors. So CIE recommended using the concept of the LED average intensity to as LED intensity […]
LEDs Test Method: Photoelectric Characteristics Testing Method – Switching Time
3000 type：Photoelectric Characteristics Testing Method Method 3001: switching time 1 Objective Measure the turn on time ton (open delay time td(on) ＋rise time tr ）of the measuring LED device and the turn off time toff （closed delay time td(off) ＋decrease time tr ). 2 Test chart Picture 13 method 3001 test chart D：Measuring LED device G1：High resistance current pulse generator G2：Dc […]
LEDs Test Method: Peak Emission Wavelength, Spectral Radiation Bandwidth and Spectrum Power Distribution
Method 2005: Peak Emission Wavelength, Spectral Radiation Bandwidth and Spectrum Power Distribution 1 Objective Measure the peak emission wavelength, spectral radiation bandwidth and spectrum power distribution of the measuring LED device under the rated condition. 2 Test chart Picture 11 method 2005 test chart D：The measuring LED device G：Current source L：Focus lens system G：Current source […]
LEDs Test Method: Radiation Flux and Radiation Efficiency
Method 2004: Radiation Flux and Radiation Efficiency 1 Objective Measure the radiation flux and radiation efficiency of the measuring LED device under the rated condition. 2 Test chart Note: the optical radiation lunched by the measuring LED device has been reflected for many times through the integrating sphere wall, that leads to uniform surface luminosity […]
LEDs Test Method: Luminous Flux and Luminous Efficiency
Method 2003: Luminous Flux and Luminous Efficiency 1 Objective Measure the luminous flux and luminous efficiency of LED device being tested under the rated condition. 2 Test Chart Picture 9 Method 2003 test chart Note 1: the optical radiation lunched by the LED device under test has been reflected many times through the integral wall […]
LEDs Test Method: Light Characteristics Measuring Methods
1 2000 type Light Characteristics Measuring Methods 1.1 Method 2001：Average LED intensity 1.1.1Objective Measure the average LED intensity of the semiconductor light-emitting diode. 1.1.2 Test chart Picture 7 Method 2001 test chart D—LED device G—Current source PD–Photo detector including the diaphragm D1 with the area A D2、D3–Eliminate the stray light diaphram D2,D3, detection solid angle should […]
LEDs Test Method: The Electrical Characteristics Testing Methods
a）1000 type: The electrical characteristics testing methods –Method 1001: forward voltage –Method 1002: reverse voltage –Method 1003: reverse current –Method 1004: total capacitance b）2000 type: Optical characteristics testing methods –Method 2001: average LED intensity –Method 2002: half intensity angle and deviation angle –Method 2003: luminous flux and luminous efficiency –Method 2004: radiation flux and radiation […]
LED Lighting Technique
Lighting for general purpose. General illumination usually uses cyclic lighting and point like lighting. Ring light is a kind of general lighting way for common use, its very easy to install on camera, it can provide enough lighting for a diffuse surface. Back lighting The back lighting refers to place the light source on the […]
Lisun Group Products List Part10: Electrical Safety Tester
Electrical Safety Tester of Lisun Group: ZRS-3H: The glow wire test apparatus is according to IEC60695-2-10～IEC60695-2-13(GB/T5169.10-2006~GB/T5169.13-2006), UL746A, IEC829, DIN695, VDE0471. ZY-3: Needle Flame Test. This electrical safety tester is fit for the industry of insulation material, engineering plastics and solid combustible material. TTC-1: Tracking Test Chamber. Test insulation material according to IEC 60112-2003, insulation resistance […]
Semiconductor LEDs Test Method
Abstract The system introduced the terms and definitions of semiconductor led test. On this basis, this paper introduced the requirements of the test methods and test devices in detail. Introduction Semiconductor led is a kind of important optoelectronic device, it has been widely applied in the scientific research and industrial and agricultural production. Although leds […]
Lisun Group Products List Part9: Electronic Components Tester
Electronic Components Tester of Lisun Group: UI9730: magnetic particle testing. Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, μm, magnetic core loss, B-H curve, U curve and I curve. UI9702: Magnetic Core Selector. Measure relative value of μm, Bs, Br, Hc integrated factor. UI9610: MOS Transistor […]
Maximum Rating and General Requirements of LEDs Test
Maximum Rating 1 The lowest and highest storage temperature（Tstg） 2 The lowest and highest working environment temperature or tube base temperature（Tamb or Tcase） 3 Inverse peak voltage（VR） Note: not used for the two pipe devices of the mutual end connection 4 The maximum continuous positive current (IF) and minus ratings curve or minus ratings coefficient in […]
The Effective Ways of Improving the Luminous Efficiency of LED
LED luminous efficiency is an important factor to measure photoelectric devices. How to improve the efficiency of LED enables it to achieve the effect of energy saving, this paper has introduced the effective ways of improving LED efficiency from the four aspects including the transparent substrate technology, metal reflecting technology, surface micro structure technology, and flip chip […]
Common Quality Problem Analysis and Strategies of LED Chips
1. High direction pressure drop, dark light A: Electrode and luminescent materials are ohmic contacts, but the contact resistance is large, which is mainly caused by the substrate materials’ low concentration or electrode defect. B: Electrode and materials are non-ohmic contacts, which mainly happens to be the extrusion seal or the chip seal and the […]
